23,31-32,34,60,62,70,100,118,122,132,140,147,160-161,164,187,264,285,736 0089:17-09-26 0089:17-09-26 15:19:51.000 0089:17-09-26 utf8 0 Oau Text txt Computermedien c Online-Ressource cr 1984317156 9798331563370 p 9798331563387 10.1109/VTS69484.2026 KXP 1984317156 eng rda 2026 826484824 Tsvz 433375485 gnd/1071861417 Konferenzschrift https://ieeexplore.ieee.org/servlet/opac?punumber=11563061 H ZZ https://doi.org/10.1109/VTS69484.2026 R ZZ ZDB-37-IEL XD-US 2026 IEEE 44th VLSI Test Symposium (VTS) 27-29 April 2026 ; conference location: Napa, CA, USA : proceedings publisher: IEEE 1984317547 Tfv3 gnd/1419722336 vie IEEE VLSI Test Symposium 44. 2026 Napa, Calif. VerfasserIn aut 100026842 Tbv1 gnd/1692-5 190140712 kiz Institute of Electrical and Electronics Engineers Herausgebendes Organ isb IEEE VLSI Test Symposium 44 Napa, CA 2026.04.27-29 VTS 44 Napa, CA 2026.04.27-29 [Piscataway, NJ] IEEE 1 Online-Ressource Illustrationen Literaturangaben 104653582 Tsv1 gnd/4117388-0 20950949X VLSI 106414070 Tkv 53.52 Elektronische Schaltungen Kalifornien 736 BSZ 17-09-26 17-09-26 20:53:05.000 utf8 17-09-26 add_ebook 1999 5035756580 17-09-26 zeb IEEE-Abo 00 https://doi.org/10.1109/VTS69484.2026 verv