nam a22 c 4500 1984317156 DE-627 20260917151951.0 cr uuu---uuuuu 260917s2026 xxu|||||o 00| ||eng c 9798331563370 9798331563370 10.1109/VTS69484.2026 doi (DE-627)1984317156 (DE-599)KXP1984317156 DE-627 ger DE-627 rda eng XD-US 53.52 bkl IEEE VLSI Test Symposium 44. 2026 Napa, Calif. VerfasserIn (DE-588)1419722336 (DE-627)1984317547 aut 2026 IEEE 44th VLSI Test Symposium (VTS) 27-29 April 2026 ; conference location: Napa, CA, USA : proceedings publisher: IEEE Kalifornien [Piscataway, NJ] IEEE 2026 1 Online-Ressource Illustrationen Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Literaturangaben Konferenzschrift (DE-588)1071861417 (DE-627)826484824 (DE-576)433375485 gnd-content s (DE-588)4117388-0 (DE-627)104653582 (DE-576)20950949X VLSI gnd (DE-627) Institute of Electrical and Electronics Engineers Herausgebendes Organ (DE-588)1692-5 (DE-627)100026842 (DE-576)190140712 isb 9798331563387 https://ieeexplore.ieee.org/servlet/opac?punumber=11563061 Verlag lizenzpflichtig 1 https://doi.org/10.1109/VTS69484.2026 Resolving-System lizenzpflichtig 1 ZDB-37-IEL 53.52 Elektronische Schaltungen (DE-627)106414070 BO 000 xxxxxny a22 3n 4500 001 5035756580 003 DE-627 004 1984317156 005 20260917205305 008 260917||||||||||||||||ger||||||| 040 ILN: 736 DE-627 ILN: 736 852 ILN: 736 85640 https://doi.org/10.1109/VTS69484.2026 939 2026-09-17 zeb