01720nas--2200445-i-4500 9924906049903341 20170904040422.9 131031cuuuu9999njuar---o-----1---a0eng-- 2013207430 2012397197 (OCoLC)861791041 (CKB)3400000000015444 (CONSER)--2013207430 (EXLCZ)993400000000015444 IEEE, 445 Hoes Lane, Piscataway, NJ 08854-4141 pcc nsdp TK7869 .L38a 621 14 Latin-American Test Workshop. Lat. Am. Test Worksh. Latin American Test Workshop ... Latin American Test Workshop. LATW ... Piscataway, NJ : Institute of Electrical and Electronics Engineers Red Hook, NY : Available from Curran Associates Annual text txt rdacontent unmediated n rdamedia volume nc rdacarrier Proceedings of workshop. Description based on: 13th (2012); title from title page. Latest issue consulted: 13th (2012). Electronic apparatus and appliances Testing Congresses. Electronic systems Testing Congresses. Computer software Testing Congresses. Computer software Testing. fast (OCoLC)fst00872601 Electronic apparatus and appliances Testing. fast (OCoLC)fst00906837 Electronic systems Testing. fast (OCoLC)fst00907491 Conference papers and proceedings. fast (OCoLC)fst01423772 Institute of Electrical and Electronics Engineers, publisher. 2373-0862 CONFERENCE 53168080000003341 61166212700003341 Available IEEE Xplore All Conference Series Available from 2009. IEEE Xplore 43ACC_UBS 9924906049903341