8 0017:13-01-25 0017:13-01-25 17:26:24.000 0017:13-01-25 utf8 0 Oou Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier 525289801 10.1109/ICHVE61955.2024.10676233 https://ieeexplore.ieee.org/document/10676233 H eng rda 2024 359646190 Konferenzschrift 18.08.2024 - 22.08.2024 Berlin, Germany Test circuit for switching behavior analysis of a model vacuum switch for DC applications Manuel Nierenberg, Myriam Koch Manuel Nierenberg Verfasser aut 359457894 Koch, Myriam&datl=1984- Verfasser aut 2024 /t4 Enthalten in 2024 IEEE International Conference on High Voltage Engineering and Applications (ICHVE) Systemvoraussetzungen: Adobe Acrobat Reader 8 13-01-25 o 13-01-25 17:26:24.000 13-01-25 utf8 1289179859 10.1109/ICHVE61955.2024.10676233 03 05