70 0089:03-08-26 0089:04-08-26 10:11:30.000 0089:04-08-26 utf8 0 Oau Text txt Computermedien c Online-Ressource cr 198077434X 9798319530127 p 9798319530134 10.1109/ICMTS69943.2026 KXP 198077434X eng rda 2026 826484824 Tsvz 433375485 gnd/1071861417 Konferenzschrift https://ieeexplore.ieee.org/servlet/opac?punumber=11471688 H ZZ https://doi.org/10.1109/ICMTS69943.2026 R ZZ ZDB-37-IEL XD-US 2026 38th IEEE International Conference on Microelectronic Test Structures (ICMTS) conference proceedings : Mar. 23-26, 2026, Kunibiki-Messe Convention Center, Matsue, Japan ICMTS - IEEE International Conference on Microelectronic Test Structures ; sponsored by: Association for Promotion of Electrical, Electrical and Information Engineering ; technical sponsored by: the IEEE Electron Devices Society ; in cooperation with: Systems Design Lab (d.lab) Platform Device Research Division, School of Engineering, the University of Tokyo 1980775516 Tfv3 gnd/1415351279 vie IEEE International Conference on Microelectronic Test Structures 38. 2026 Matsue VerfasserIn aut 100026842 Tbv1 gnd/1692-5 190140712 kiz Institute of Electrical and Electronics Engineers Herausgebendes Organ isb 102144796 Tbv1 gnd/121920-0 190639911 kiz IEEE Electron Devices Society SponsorIn spn IEEE International Conference on Microelectronic Test Structures 38 Matsue 2026.03.23-26 ICMTS 38 Matsue 2026.03.23-26 [Piscataway, NJ] IEEE 1 Online-Ressource Illustrationen Literaturangaben 10641853X Tkv 53.55 Mikroelektronik 106418610 Tkv 53.15 Elektrische Messtechnik und Prüftechnik Abweichender Titel Proceedings of the 2026 IEEE International Conference on Microelectronic Test Structures Thirty-eighth 70 PICA 03-08-26 03-08-26 14:34:11.000 utf8 03-08-26 2729 0089 5008541900 03-08-26 z RO 6565(38) als elektronische Ressource im Fernzugriff 01 https://ieeexplore.ieee.org/servlet/opac?punumber=11471688 IEEE Konferenzpaket. Kopienbestellung möglich. Campusfrei Universität Hannover