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991020114487705509
20241126213016.0
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2016202268
2472-761X
(OCoLC)950750614
(CKB)4100000008868714
(CONSER)--2016202268
(EXLCZ)994100000008868714
IEEE, 445 Hoes Lane, Piscataway, NJ 08854-4141
pcc
nsdp
ISSN RECORD
621.38195
23
IEEE East-West Design & Test Symposium.
East-West Des. Test Symp.
(Online)
East-West Design and Test Symposium
(Online)
... East-West Design and Test Symposium.
EWDTS ...
Some issues may have title:
Proceedings
Volume for 2010 have title:
Proceedings of IEEE East-West Disign & Test Symposium
Proceedings of IEEE East-West Disign and Test Symposium
IEEE East-West Design & Test International Symposium
Piscataway, NJ :
Institute of Electrical and Electronics Engineers, Inc
Annaul
text
txt
rdacontent
computer
c
rdamedia
online resource
cr
rdacarrier
Print began in 2003?
Description based on: 2008; title from PDF title page (IEEEXplore website, viewed on May 28, 2016)..
Latest issue consulted: 2014 (viewed on May 28, 2016).
Computer engineering
Congresses.
Electronic circuit design
Congresses.
Electronic circuits
Testing
Congresses.
Electronic digital computers
Circuits
Testing
Congresses.
Integrated circuits
Testing
Congresses.
Computer engineering.
fast
(OCoLC)fst00872078
Electronic circuit design.
fast
(OCoLC)fst00906862
Electronic circuits
Testing.
fast
(OCoLC)fst00906898
Electronic digital computers
Circuits
Testing.
fast
(OCoLC)fst00907134
Integrated circuits
Testing.
fast
(OCoLC)fst00975593
Periodicals.
fast
(OCoLC)fst01411641
Conference papers and proceedings.
fast
(OCoLC)fst01423772
Institute of Electrical and Electronics Engineers.
Kharkivsʹkyĭ nat︠s︡ionalʹnyĭ universytet radioelektroniky.
CONFERENCE
53539293190005509
61538029030005509
Available
IEEE Electronic Library (IEL)
Available from 2008.
IEEE Xplore
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991020114487705509