1.2 10 1.2 1 10 mods info:srw/schema/1/mods-v3.5 xml 1Institute of Electrical and Electronics Engineers,author,issuing body.textconference publicationtextnjuPiscataway, NJ :Institute of Electrical and Electronics Engineers,2022.2022single uniteng

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Institute of Electrical and Electronics Engineers.MicroelectronicsCongresses.TK7874 .I57 2022621.381978166546816916654681652022rdaNjHacI24051420241212213443.099116810068005521Converted from MARCXML to MODS version 3.6 using MARC21slim2MODS3-6.xsl (Revision 1.119 2018/06/21)eng info:srw/schema/1/mods-v3.5 xml 2Der in der detailstatistischen Auswertung nach ZilerBrosat, HanneloreTötemeyer, NadjaHermann, ZilertextTestmaterialbookgwMünsterAschendorff2010Neubearb. Aufl.single unitger

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57 S. : Ill.Hannelore Brosat, Nadja TötemeyerFrühere Aufl. u.d.T.: Ziler, Hermann : Der Mann-Zeichen-Test in detail-statistischer AuswertungLiteraturverz.ZeichenZeichnenProjektiver Test97834020470402010SzZuIDS NEBIS UZH08102020201229194258.0990093937860205521Converted from MARCXML to MODS version 3.6 using MARC21slim2MODS3-6.xsl (Revision 1.119 2018/06/21) info:srw/schema/1/mods-v3.5 xml 3A the material culture of the Persian period as a test caseFrevel, Christian,1962-edtPyschny, Katharina,1984-edtCornelius, Izak,1958-edttextgovernment publicationszFribourgAcademic PressGöttingenVandenhoeck & Ruprecht[2014]2014single uniteng1 Online-Ressource (VI, 440 Seiten)Christian Frevel, Katharina Pyschny, Izak Cornelius (eds.)A Druck-Ausgabe, Academic Press9783727817533A Druck-Ausgabe, Vandenhoeck & Ruprecht9783525543924267Open Access2014rdaCH-ZuSLS UBE24072520240725132849.099117021259405521Converted from MARCXML to MODS version 3.6 using MARC21slim2MODS3-6.xsl (Revision 1.119 2018/06/21)ger info:srw/schema/1/mods-v3.5 xml 4livre 2.O Dieu, la gloire, qui t'est deuëSweelinck, Jan Pieterszoon,1562-1621.notated musicbookgwWiesbaden :Breitkopf and Härtel,[1901]1901single unitfreaccess

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1 online resource (p. 166-169)by Jan Pieterszoon Sweelinck.1 full score.For six part mixed voices.Originally from "Werken van Jan Pieterszn. Sweelinck" edited by Max Seiffert.Title from HTML t.p. (viewed Apr. 24, 2009).French words.Choruses, Sacred (Mixed voices), Unaccompanied.Part songs, French.Part songs, Sacred.Psalms (Music)8569092821901aacrVaAlASP13082620261104175415.099116760143405521Converted from MARCXML to MODS version 3.6 using MARC21slim2MODS3-6.xsl (Revision 1.119 2018/06/21) info:srw/schema/1/mods-v3.5 xml 5Institute of Electrical and Electronics Engineers,author,issuing body.texttextbookxx[Place of publication not identified]IEEE1998monographiceng

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A report is given on the IEEE Standard for VHDL waveform and vector exchange to support design and test verification (WAVES) Language Reference Manual. This standard is a formal notation intended for use in all phases of the development of electronic systems. Because it is both machine-readable and human-readable, it supports the verification and testing of hardware designs; the communication of hardware design and test verification data; and the maintenance, modification, and procurement of hardware systems. This standard provides the syntactic and semantic framework for the unambiguous expression and aggregation of digital test data and timing information necessary to completely describe a test or set of tests for a digital system. WAVES digital test data (stimulus and expected responses) is described at the logic level. Voltage and current values are not described by WAVES and are beyond the scope of this standard.Keywords -- Metrics -- Versions.Bibliographic Level Mode of Issuance: MonographEnglishElectronic systemsTesting.SemiconductorsDesign and construction.VHDL (Computer hardware description language)TK7870.23 .I578 1998621.3810-7381-1445-60-7381-3945-90-7381-1446-41998PQKB16082920210807000313.099116731750005521Converted from MARCXML to MODS version 3.6 using MARC21slim2MODS3-6.xsl (Revision 1.119 2018/06/21) info:srw/schema/1/mods-v3.5 xml 6textgovernment publicationxxIET2024single uniteng

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97818372419101837241910202425020320250203212133.099116983444805521Converted from MARCXML to MODS version 3.6 using MARC21slim2MODS3-6.xsl (Revision 1.119 2018/06/21) info:srw/schema/1/mods-v3.5 xml 7Institute of Electrical and Electronics Engineers,author,issuing body.texttextbookxx[Place of publication not identified] :IEEE,2024.2024single uniteng

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Institute of Electrical and Electronics Engineers.Mixed-use developments.HD1390 .I578 2024333.731597988557146542024rdaNjHacI25081220250812180147.099116973385405521Converted from MARCXML to MODS version 3.6 using MARC21slim2MODS3-6.xsl (Revision 1.119 2018/06/21)eng info:srw/schema/1/mods-v3.5 xml 8Institute of Electrical and Electronics Engineers,author,issuing body.texttextbookxx[Place of publication not identified] :IEEE,2022.2022single uniteng

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Circuitry that may be added to an integrated circuit to provide access to on-chip Test Access Ports (TAPs) specified by IEEE Std 1149.1 is described in this standard. The circuitry uses IEEE Std 1149.1 as its foundation, providing complete backward compatibility, while aggressively adding features to support test and applications debug. It defines six classes of IEEE 1149.7 Test Access Ports (TAP.7s), T0 to T5, with each class providing incremental capability, building on that of the lower level classes. Class T0 provides the behavior specified by 1149.1 from startup when there are multiple on-chip TAPs. Class T1 adds common debug functions and features to minimize power consumption. Class T2 adds operating modes that maximize scan performance. It also provides an optional hot-connection capability to prevent system corruption when a connection is made to a powered system. Class T3 supports operation in either a four-wire Series or Star Scan Topology. Class T4 provides for communication with either a two-pin or four-pin interface. The two-pin operation serializes IEEE 1149.1 transactions and provides for higher Test Clock rates. Class T5 adds the ability to perform data transfers concurrently with scan, supports utilization of functions other than scan, and provides control of TAP.7 pins to custom debug technologies in a manner that ensures current and future interoperability.Institute of Electrical and Electronics Engineers.Integrated circuits.TK7874 .I578 2022621.3815979-88-557-1227-82022rdaNjHacI25081220250812134739.099116952689205521Converted from MARCXML to MODS version 3.6 using MARC21slim2MODS3-6.xsl (Revision 1.119 2018/06/21)eng info:srw/schema/1/mods-v3.5 xml 9Institute of Electrical and Electronics Engineers,author,issuing body.texttextbooknyuNew York :IEEE,2022.2022single uniteng

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Circuitry that may be added to an integrated circuit to provide access to on-chip Test Access Ports (TAPs) specified by IEEE Std 1149.1 is described in this standard. The circuitry uses IEEE Std 1149.1 as its foundation, providing complete backward compatibility, while aggressively adding features to support test and applications debug. It defines six classes of IEEE 1149.7 Test Access Ports (TAP.7s), T0 to T5, with each class providing incremental capability, building on that of the lower level classes. Class T0 provides the behavior specified by 1149.1 from startup when there are multiple on-chip TAPs. Class T1 adds common debug functions and features to minimize power consumption. Class T2 adds operating modes that maximize scan performance. It also provides an optional hot-connection capability to prevent system corruption when a connection is made to a powered system. Class T3 supports operation in either a four-wire Series or Star Scan Topology. Class T4 provides for communication with either a two-pin or four-pin interface. The two-pin operation serializes IEEE 1149.1 transactions and provides for higher Test Clock rates. Class T5 adds the ability to perform data transfers concurrently with scan, supports utilization of functions other than scan, and provides control of TAP.7 pins to custom debug technologies in a manner that ensures current and future interoperability.IEEE.Electronic controllers.Debugging in computer science.Boundary scan testing.TK7881.2 .I578 2022621.461-5044-8875-X10.1109/IEEESTD.2022.99191402022rdaNjHacI23121420231214123445.099116818859505521Converted from MARCXML to MODS version 3.6 using MARC21slim2MODS3-6.xsl (Revision 1.119 2018/06/21)eng info:srw/schema/1/mods-v3.5 xml 10Institute of Electrical and Electronics Engineers,author,issuing body.texttextbooknyuIEEE2020-05-13New York :IEEE,2020.2020single uniteng

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Instructions for conducting generally applicable and accepted tests to determine the performance characteristics of synchronous machines are contained in this guide. Although the tests described are applicable in general to synchronous generators, synchronous motors (larger than fractional horsepower), synchronous condensers, and synchronous frequency changers, the descriptions make reference primarily to synchronous generators and synchronous motors.IEEE.Synchronous generators.Electric machineryTesting.TK2765 .I578 2020621.31341-5044-6695-0978150446695015044669502020rdaNjHacI23121420260624213116.099116732015305521Converted from MARCXML to MODS version 3.6 using MARC21slim2MODS3-6.xsl (Revision 1.119 2018/06/21)eng